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Ivan G. Kuznetsov
at NASA Goddard Space Flight Ctr
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 22 September 2005 Paper
Calibration of the New Horizons Long-Range Reconnaissance Imager
F. Morgan, S. Conard, H. Weaver, O. Barnouin-Jha, A. Cheng, H. Taylor, K. Cooper, R. Barkhouser, R. Boucarut, E. Darlington, M. Grey, I. Kuznetsov, T. Madison, M. Quijada, D. Sahnow, J. Stock
Proceedings Volume 5906, 59061E (2005) https://doi.org/10.1117/12.616880
KEYWORDS: Calibration, Charge-coupled devices, Sensors, Bandpass filters, Collimators, Photodiodes, Temperature metrology, Telescopes, Pluto, Imaging systems
Proceedings Article | 22 January 2004 Paper
Grating efficiencies comparison study: calculations versus metrology for various types of high-groove density gratings at VUV-UV wavelengths
Ivan Kuznetsov, Erik Wilkinson, David Content, Rene Boucarut, Timothy Madison
Proceedings Volume 5178, (2004) https://doi.org/10.1117/12.507946
KEYWORDS: Coating, Atomic force microscopy, Sensors, Data modeling, Aluminum, Diffraction gratings, Scatter measurement, Holography, Mirrors, Light sources
Proceedings Article | 30 January 2002 Paper
Design, performance, and reliability of a high-angular-resolution wide-angular-range large-aperture fully-automated UV scatterometer
Proceedings Volume 4485, (2002) https://doi.org/10.1117/12.454277
KEYWORDS: Sensors, Mirrors, Light sources, Lamps, Scatter measurement, Vacuum ultraviolet, Bidirectional reflectance transmission function, Ultraviolet radiation, Light scattering, Monochromators
Proceedings Article | 30 January 2002 Paper
Grating groove metrology and efficiency predictions from the soft x-ray to the far infrared
Proceedings Volume 4485, (2002) https://doi.org/10.1117/12.454276
KEYWORDS: Polarization, Metrology, Atomic force microscopy, Lithium, Diffraction gratings, Profilometers, Calibration, Reflection, Solids, Statistical modeling
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