Ivan N. Sudarikov
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 July 2016 Paper
Proceedings Volume 9912, 991212 (2016) https://doi.org/10.1117/12.2231595
KEYWORDS: Error analysis, Lenses, Optical testing, Wavefronts, Laser systems engineering, Optical testing, Interferometers, Objectives, Distance measurement, Stereolithography, Liquid crystals

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