Javier Lasobras
Development Engineer at BSH Electrodomésticos España SA
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11129, 111290G (2019) https://doi.org/10.1117/12.2526382
KEYWORDS: Temperature metrology, Infrared radiation, Thermometry, Thermography, Control systems, Infrared sensors, Glasses, Infrared imaging, Sensors

Proceedings Article | 8 May 2008 Paper
Proceedings Volume 6997, 69971S (2008) https://doi.org/10.1117/12.781222
KEYWORDS: Modulation, Modulators, Optical testing, Laser sintering, Spectrum analysis, Phase shift keying, Integrated optics, Continuous wave operation, Optical spectroscopy, Semiconductor lasers

Proceedings Article | 7 February 2007 Paper
Proceedings Volume 6484, 64840K (2007) https://doi.org/10.1117/12.699998
KEYWORDS: Vertical cavity surface emitting lasers, Laser damage threshold, Spectrum analysis, Continuous wave operation, Antireflective coatings, Semiconductor lasers, Optical filters, Modulation, Optical testing

Proceedings Article | 14 April 2006 Paper
Proceedings Volume 6184, 61841O (2006) https://doi.org/10.1117/12.661944
KEYWORDS: Optical filters, Modulation, Laser damage threshold, Spectrum analysis, Filtering (signal processing), Continuous wave operation, High dynamic range imaging, Network security, Optical testing, Optical fibers

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