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Jeff M. Dickert
at Lawrence Berkeley National Lab
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Author
Publications (4)
Proceedings Article | 12 October 2023 Presentation
Towards a new generation long trace profiler LTP-2020: design, motion control, and performance of a two-carriage gantry system
Proceedings Volume 12695, 1269504 (2023) https://doi.org/10.1117/12.2677786
KEYWORDS: Design and modelling, Control systems, Motion controllers, Sensors, X-ray optics, Optical surfaces, Optical sensors, Mirrors, Ceramics, X-rays
Proceedings Article | 3 October 2023 Presentation + Paper
Towards new generation long trace profiler LTP-2020: system design with different sensors in different operation modes
Proceedings Volume 12695, 1269505 (2023) https://doi.org/10.1117/12.2677861
KEYWORDS: Sensors, Mirrors, Metrology, Diffraction gratings, Design and modelling, Autocollimators, X-ray optics, Mirror surfaces, X-rays, Optical surfaces
Proceedings Article | 21 August 2020 Paper
Multifunctional light beam source for surface slope measuring long trace profilers
Proceedings Volume 11492, 1149205 (2020) https://doi.org/10.1117/12.2570462
KEYWORDS: Mirrors, Spatial resolution, Light sources, Light, Point spread functions, Metrology, Diffraction gratings, Optical sensors, X-rays
Proceedings Article | 2 October 2019 Presentation + Paper
Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state-of-the-art x-ray mirrors
Proceedings Volume 11109, 1110905 (2019) https://doi.org/10.1117/12.2529519
KEYWORDS: Calibration, Mirrors, Autocollimators, Error analysis, X-ray optics, Precision calibration, X-rays, Profilometers, Metrology, Sensors
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