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Jens Scherer
at Fraunhofer Institute for Physical Measurement Techniques IPM
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Publications (2)
Proceedings Article | 15 August 2023 Presentation + Paper
In-line fluorescence detector for production control in robot-driven environments
Vivien Behrendt, Dominic Buchta, Stefan Adolph, Christian Lutz, Jens Scherer, Alexander Blättermann
Proceedings Volume 12618, 126181O (2023) https://doi.org/10.1117/12.2673394
KEYWORDS: Fluorescence, Sensors, Metals, Laser scanners, Scanners, Photomultipliers, Fourier transforms, Contamination analysis, Surface quality testing, Film thickness, Organic materials
Proceedings Article | 15 August 2023 Presentation + Paper
An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic products
Benedikt Hauer, Adrian Dorfschmidt, Friederike Münch, Jens Scherer, Daniel Carl
Proceedings Volume 12618, 126181L (2023) https://doi.org/10.1117/12.2673229
KEYWORDS: Film thickness, Sensors, Infrared radiation, Inspection, Polymers, Reflection, Plasma, Plastics, Thin film coatings, Signal processing, Coating, Optical inspection
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