Surface electronic properties of CdxZnyTe were characterized through scanning spreading resistance microscopy
(SSRM) and correlated IR transmittance maps. We observed the magnitude of the SSRM current is dominant by
the density of surface localized Te precipitates and spatial variation of Zn content. The magnitude of the average
SSRM current for forward probe bias was found to correlate strongly with the density of Te precipitates, while
the variation in I-V characteristics were caused by slight p-type or n-type characteristics due to non-uniformity in
Zn content of the crystal. Experimentally observed I-V characteristics were simulated using thermionic emission
theory.
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