Dr. Jin Wei
at MIIT-EIDC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 December 2019 Paper
Proceedings Volume 11342, 113420V (2019) https://doi.org/10.1117/12.2550382
KEYWORDS: Safety, Control systems, Standards development, Manufacturing, Clouds, Information security, Telecommunications, Product safety, 3D modeling, Radar

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