Mr. Jinwei Zhu Profile

Jinwei Zhu

at Hong Kong Univ of Science and Technology

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 7 March 2019 Paper

Review of the opaque coolant barrier removal techniques for in-process form profile optical measurement

J. Zhu, Y. Gao

Proceedings Volume 11053, 1105304 (2019) https://doi.org/10.1117/12.2517179

KEYWORDS: Optical testing, Opacity, Liquids, Sensors, Precision measurement, Error analysis, Manufacturing, Water, Optics manufacturing, Feedback control

Read Abstract +

In-process measurement can provide feedback for control of workpiece precision in terms of size, form error, and roughness. It can be used for precision control of a machining process, therefore to improve productivity and reduce defect rates. Optical measurement methods have greater advantages in the in-process form profile measurement systems due to their non-contact type and high precision. However, use of opaque coolant in precision machining will introduce an opaque barrier problem, making the workpiece surface y(x, z) inaccessible to the optical measurement devices. To solve this problem, several approaches, including the water beam approach, the single air beam approach, the multiple air beam approach, and the dual coolant displacing medium method, are examined in terms of coolant removal capability, level of acceptance to surface complexity, flow rate and velocity of the coolant displacing media, and also errors induced by the coolant removal methods. The results of the study show that the multiple air beam method and the dual coolant displacing media method are more advantageous than the other methods.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years