Dr. Jonathan Korn
Engineering Specialist at The Aerospace Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2004 Paper
Jonathan Korn, Howard Holtz, Morton Farber
Proceedings Volume 5428, (2004) https://doi.org/10.1117/12.541171
KEYWORDS: Statistical analysis, Computer simulations, Surveillance systems, Motion models, Infrared radiation, Infrared sensors, Modulation, Sensors, Error analysis, Signal to noise ratio

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top