Prof. Jun Chen Profile

Prof. Jun Chen

Professor at Tokyo Polytechnic Univ

SPIE Involvement:

Author

Proceedings Article | 26 April 2019 Paper

Global optimization of two-multilayer mirror objective for focusing soft X-ray high harmonics

M. Toyoda, S. Yamashita, J. Chen

Proceedings Volume 11032, 110320P (2019) https://doi.org/10.1117/12.2520543

KEYWORDS: Mirrors, Objectives, X-rays, Optical design, Computer aided design, Ray tracing, Geometrical optics, Paraxial approximations, Aberration theory, X-ray diffraction

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Proceedings Article | 19 February 2018 Paper

Development of a color mixer for mixed color education and its outreach activities

S. Nakadate, Y. Kume, M. Shibuya, J. Chen, Y. Azuma, T. Moriyama

Proceedings Volume 10556, 105560H (2018) https://doi.org/10.1117/12.2292976

KEYWORDS: Light emitting diodes, Printing, Color reproduction, Light sources and illumination, LCDs, Translucency, Televisions, Optical filters

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Proceedings Article | 2 February 2009 Paper

Phase-shifting interferometry using a multi-mode blue laser diode

Jun Chen, Yoh Tanaka, Suezou Nakadate, Yukihiro Ishii

Proceedings Volume 7157, 715702 (2009) https://doi.org/10.1117/12.811995

KEYWORDS: Semiconductor lasers, Phase shifts, Wavefronts, Interferometers, Phase interferometry, Fringe analysis, Gallium nitride, Laser development, Digital video discs, Phase shift keying

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Proceedings Article | 20 January 2005 Paper

Phase-shifting interferometry using an SHG blue laser diode

Jun Chen, Yoh Tanaka, Michio Kiyohara, Motosuke Kiyohara

Proceedings Volume 5633, (2005) https://doi.org/10.1117/12.577051

KEYWORDS: Second-harmonic generation, Wavefronts, Phase shifts, Semiconductor lasers, Interferometers, Phase interferometry, Tunable lasers, Laser stabilization, Laser development, Digital video discs

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SPIE Journal Paper | 1 January 2003

Phase-shifting Fizeau interference microscope with a wavelength-shifted laser diode

Yukihiro Ishii, Jun Chen, Ribun Onodera, Taizo Nakamura

OE, Vol. 42, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1524171

KEYWORDS: Phase shifts, Mirrors, Microscopes, Fizeau interferometers, Reflection, Reflectivity, Thin films, Phase measurement, Semiconductor lasers, Interferometers

Proceedings Article | 20 September 2002 Paper

Quantitative phase measurement interference microscope for transparent objects

Jun Chen, Junji Endo, Hiroyuki Fujita

Proceedings Volume 4919, (2002) https://doi.org/10.1117/12.465754

KEYWORDS: Phase shifts, Microscopes, Waveguides, Refractive index, Phase measurement, Wavefronts, Beam splitters, Phase interferometry, Optical microscopes, Glasses

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Proceedings Article | 20 September 2002 Paper

Balanced homodyne detection technique for surface nonlinear optics

Jun Chen, Susumu Machida, Yoshihisa Yamamoto

Proceedings Volume 4919, (2002) https://doi.org/10.1117/12.465753

KEYWORDS: Second-harmonic generation, Signal detection, Nonlinear optics, Homodyne detection, Nonlinear crystals, Crystals, Modulation, Silicon, Optical amplifiers, Polarization

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Proceedings Article | 8 May 2001 Paper

Phase-shifting interference microscopy using a Fresnel's biprism

Jun Chen, Junji Endo, Yoshiaki Niino, Hiroyuki Fujita

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427038

KEYWORDS: Phase shifts, Microscopes, Microscopy, Phase measurement, Optical engineering, Optical sensing, Nanotechnology, Chromium, Transducers, Phase shifting

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Proceedings Article | 19 July 1999 Paper

Balanced-homodyne detection of surface second-harmonic generation

Jun Chen, Susumu Machida, Yoshihisa Yamamoto

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.354771

KEYWORDS: Second-harmonic generation, Signal detection, Optical amplifiers, Homodyne detection, Beam splitters, Signal generators, Mirrors, Crystals, Harmonic generation, Interfaces

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Proceedings Article | 7 May 1999 Paper

Spectroscopic study on second-harmonic generation from a reconstructed silicon surface

Jun Chen, Dehuan Huang

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347716

KEYWORDS: Second-harmonic generation, Silicon, Spectroscopy, Optical filters, Polarization, Harmonic generation, Sapphire lasers, Ultraviolet radiation, Resonance enhancement, Chemical species

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Proceedings Article | 7 May 1999 Paper

Accurate measurement of the flatness of etalons

Shin-ichi Itoh, Kentaro Katoh, Tsuyoshi Oikawa, Jun Chen

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347756

KEYWORDS: Fabry–Perot interferometers, CCD cameras, Data acquisition, Helium neon lasers, Fabry–Perot interferometry, Scattering, Precision measurement, Photography, Refractive index, Optical engineering

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Showing 5 of 11 publications

Conference Committee Involvement (5)

Optical Metrology and Inspection for Industrial Applications VI

21 October 2019 | Hangzhou, China

Optical Metrology and Inspection for Industrial Applications III

9 October 2014 | Beijing, China

Optical Metrology and Inspection for Industrial Applications II

5 November 2012 | Beijing, China

Advanced Materials and Devices for Sensing and Imaging III

12 November 2007 | Beijing, China

Advanced Materials and Devices for Sensing and Imaging II

8 November 2004 | Beijing, China

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