Dr. Junfei Dai
at Zhejiang Univ
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | 18 October 2023
Wang Xiang, Linrui Wang, Junfei Dai
OE, Vol. 62, Issue 10, 104104, (October 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.10.104104
KEYWORDS: Phase unwrapping, 3D metrology, Cameras, Fringe analysis, Projection systems, Video, 3D modeling, Phase shifts, Optical engineering, Structured light

Proceedings Article | 27 January 2023 Paper
Linrui Wang, Wang Xiang, Junfei Dai
Proceedings Volume 12550, 1255021 (2023) https://doi.org/10.1117/12.2666805
KEYWORDS: Nose, Phase shifts, Cameras, Bridges, Reconstruction algorithms, Imaging systems, Structured light, Projection systems, Phase unwrapping, 3D modeling

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 95240J (2015) https://doi.org/10.1117/12.2186285
KEYWORDS: Binary data, Diffusion, Phase shifting, Gaussian filters, Phase shifts, Fringe analysis, Projection systems, Calibration, 3D metrology, Precision measurement

Proceedings Article | 13 November 2014 Paper
Proceedings Volume 9276, 92760C (2014) https://doi.org/10.1117/12.2070799
KEYWORDS: Phase shifts, Optimization (mathematics), Binary data, Diffusion, Fringe analysis, 3D metrology, Phase shifting, Gaussian filters, Projection systems, Phase shift keying

SPIE Journal Paper | 25 April 2014
Wei Luo, Zengyu Su, Min Zhang, Wei Zeng, Junfei Dai, Xianfeng Gu
OE, Vol. 53, Issue 11, 112209, (April 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.11.112209
KEYWORDS: Optical engineering, 3D acquisition, Associative arrays, 3D scanning, Distortion, Global Positioning System, Brain mapping, Scanners, Phase shifting, Diffusion

Showing 5 of 8 publications
Conference Committee Involvement (5)
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
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