Kai Chen
at Siemens Shanghai Medical Equipment Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 February 2021 Paper
Proceedings Volume 11595, 115950L (2021) https://doi.org/10.1117/12.2581707
KEYWORDS: Convolutional neural networks, X-rays, X-ray computed tomography, Systems modeling, Image quality, Convolution, X-ray detectors, Sensors, Detection and tracking algorithms, Calibration

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