Katsuhiro Nakae
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 October 2014 Paper
Kyuki Shibuya, Katsuhiro Nakae, Yasuhiro Mizutani, Tetsuo Iwata
Proceedings Volume 9225, 922505 (2014) https://doi.org/10.1117/12.2061711
KEYWORDS: Signal to noise ratio, Microscopy, Visibility, Spatial resolution, Sensors, Imaging systems, Speckle pattern, Image processing, Objectives, Light scattering

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