Dr. Ken Goto
at Tamura Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2020 Paper
Proceedings Volume 11281, 112810L (2020) https://doi.org/10.1117/12.2544818
KEYWORDS: Reliability

Proceedings Article | 23 February 2018 Paper
Masataka Higashiwaki, Man Hoi Wong, Keita Konishi, Yoshiaki Nakata, Chia-Hung Lin, Takafumi Kamimura, Lingaparthi Ravikiran, Kohei Sasaki, Ken Goto, Akinori Takeyama, Takahiro Makino, Takeshi Ohshima, Akito Kuramata, Shigenobu Yamakoshi, Hisashi Murakami, Yoshinao Kumagai
Proceedings Volume 10533, 105330O (2018) https://doi.org/10.1117/12.2292666
KEYWORDS: Gallium, Field effect transistors, Transistors, Diodes, Silicon, Gamma radiation, Electronic components, Oxides, Silicon carbide, Gallium nitride

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