Mr. Kenmei Sawagami Profile

Kenmei Sawagami

at Osaka Univ.

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 31 August 2022 Presentation + Paper

Sub-arcsecond x-ray imaging with Multi-Image X-ray Interferometer Module (MIXIM): introduction of a periodic coded-aperture mask

Kazunori Asakura, Kiyoshi Hayashida, Shotaro Sakuma, Ayami Ishikura, Kenmei Sawagami, Wataru Kamogawa, Tomokage Yoneyama, Hirofumi Noda, Koki Okazaki, Maho Hanaoka, Kengo Hattori, Yusuke Matsushita, Taisei Mineta, Marina Yoshimoto, Yuichi Ode, Tomohiro Hakamata, Hironori Matsumoto, Hiroshi Tsunemi

Proceedings Volume 12181, 1218129 (2022) https://doi.org/10.1117/12.2629656

KEYWORDS: X-rays, Spatial resolution, X-ray imaging, Coded apertures, Interferometers, Sensors, X-ray detectors, Transmittance, X-ray sources, X-ray astronomy

Read Abstract +

Proceedings Article | 18 December 2020 Presentation + Paper

Sub-arcseconds to micro-arcsecond x-ray imaging with multi image x-ray interferometer method (MIXIM): concept and scalabe mission plans

Kiyoshi Hayashida, Kazunori Asakura, Ayami Ishikura, Shotaro Sakuma, Takashi Hanasaka, Tomoki Kawabata, Tomokage Yoneyama, Hirofumi Noda, Koki Okazaki, Maho Hanaoka, Kengo Hattori, Kenmei Sawagami, Wataru Kamogawa, Hiroshi Nakajima, Yusuke Matsuhita, Taisei Mineta, Marina Yoshimoto, Tomohiko Hakamata, Yuichi Ode, Hironori Matsumoto, Hiroshi Tsunemi, Hisamitsu Awaki, Yuichi Terashima, Toshihiro Kawaguchi

Proceedings Volume 11444, 114441C (2020) https://doi.org/10.1117/12.2562193

KEYWORDS: X-ray imaging, X-rays, Interferometers, Diffraction gratings, Sensors, Image resolution, Spatial resolution, Satellites, Astronomy, Visibility

Read Abstract +

Proceedings Article | 13 December 2020 Poster + Paper

New method to make a smooth surface on Carbon Fiber Reinforced Plastic (CFRP) substrate

H. Awaki, N. Aida, K. Asakura, M. Hanaoka, K. Hattori, K. Ishibashi, M. Ishida, A. Ishikura, Y. Maeda, H. Matsumoto, Y. Matsushita, T. Mineta, I. Mitsuishi, T. Miyazawa, N. Nakaniwa, K. Nakazawa, Y. Ode, C. Oue, K. Sawagami, S. Sugita, H. Suzuki, H. Takahashi, Y. Uchida, R. Yamamoto, M. Yoshimoto

Proceedings Volume 11444, 114447P (2020) https://doi.org/10.1117/12.2561890

KEYWORDS: Mirrors, Carbon, Surface roughness, X-rays, Reflectivity, Composites, Aerospace engineering, Lightweight mirrors, Glasses, Image quality

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years