Kristof Teelen
at Hogeschool Gent
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 January 2005 Paper
Proceedings Volume 5675, (2005) https://doi.org/10.1117/12.587762
KEYWORDS: Sensors, Image registration, Optical inspection, Machine vision, Computer vision technology, Error analysis, Matrices, Image classification, Affine motion model, Visual process modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top