Kulbir Singh Ahluwalia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 April 2020 Presentation
Proceedings Volume 11421, 114210J (2020) https://doi.org/10.1117/12.2557416
KEYWORDS: Machine learning, Near infrared, Nondestructive evaluation, Near infrared spectroscopy, Calibration, Smoothing, Wavelets, Principal component analysis, Artificial neural networks, Visual process modeling

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