Dr. Kyoung-Min Kim
at Semicon Light Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019 Presentation + Paper
Proceedings Volume 10940, 1094002 (2019) https://doi.org/10.1117/12.2506918
KEYWORDS: Light emitting diodes, Deep ultraviolet, External quantum efficiency, Aluminum nitride, Reliability, Internal quantum efficiency, Quantum efficiency

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