The problem of laser induced damage of optical materials is one bottleneck to restrict laser power levels and beam quality enhances unceasingly. The research on laser induced optical material damage, improving optical material laser damage threshold, becomes a hot issue in the development of laser technology. In this paper, laser-induced sapphire damage morphology using nanosecond 1064nm Nd: YAG is reported. Analyzed the temperature variation of sapphire inclusion under different laser fluence irradiation, and the temperature variation of inclusion's dimension radius by finite element method. The laser-induced damage experiment of sapphire materials are investigated (pulse width is 6ns). At the same time, the sapphire laser-induced damage threshold, the damage position distribution, the influence of different laser fluence on the damage area and damage growth characteristics are analyzed. Results show that the inclusion absorption mechanisms can better explain the sapphire under the nanosecond laser pulse irradiation damage, and simulation results are in agreement with the experimental results. In addition, for 1-on-l irradiation, the surface damage area for sapphire surface increase linearly, for s-on-1 irradiation, the damage area on the back surface increases exponentials with the increase of shot number.
Based on the finite element analysis method, establishment of a three dimensional fused silica lens model under the laser
irradiation, and simulated the ideal fused silica surface temperature field and thermal stress field distribution situation,
then the influences of subsurface deficiency on fused silica‘s laser damage threshold (LDT) were analyzed, which
include scratch and impurity. It is found that the deficiencies in subsurface may affect the distribution of temperature
field and thermal stress field of the fused silica surface, which makes the injected laser beams energy centralize on a
small area around the deficiencies, thus leading to stress cracking of fused silica and LDT reduction.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.