Dr. Lu Gao
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2010 Paper
Lu Gao, Jihui Wang, Weiqi Jin, Xingdao He
Proceedings Volume 7854, 78543I (2010) https://doi.org/10.1117/12.869621
KEYWORDS: Electronic components, Microscopy, Thermography, Microscopes, Microelectromechanical systems, Photomicroscopy, Reliability, Light emitting diodes, Silicon, Infrared imaging

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