Mr. Lucas Pfeifer Profile

Lucas Pfeifer

at OPTOCRAFT GmbH

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 30 November 2023 Presentation + Paper

Wavefront testing of optical windows and mirrors

C. Brock, L. Pfeifer, J. Pfund

Proceedings Volume 12778, 127780L (2023) https://doi.org/10.1117/12.2684299

KEYWORDS: Wavefronts, Mirrors, Wavefront sensors, Windows, Optical testing, Collimation, Telescopes, Reflection, Plano, Optical alignment

Read Abstract +

Protective glasses are used to protect camera modules and optical sensors from mechanical stress or environmental influences. To ensure consistent quality and avoid image distortion caused by these optics, the transmitted wavefront needs to be controlled and defects like inclusions need to be detected. This way, identification of defective parts and monitoring of the manufacturing process becomes possible. In this paper we discuss transmitted light test setups for wavefront testing of optical windows and the accuracy and stability that can be achieved. Additionally, we show procedures for wavefront-guided alignment of optical systems. The second part of the paper deals with the testing of fast steering mirrors, which are often used in free-space communication or fast scanning applications. The reflected wavefront carries information about the quality of the 3D surface shape. We demonstrate how to assess the mirror quality using a reflected light test setup.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years