Mr. Mario Castro Profile

Mario Castro

at Universidad Católica de Chile

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Publications (1)

Proceedings Article | 29 August 2022 Paper

Accurate metrology for focal plane astronomical instruments

L. Vanzi, C. Bechet, M. Flores, A. Zapata, M. Parra, T. Shen, R. Dunner, M. Castro

Proceedings Volume 12188, 121883Y (2022) https://doi.org/10.1117/12.2629684

KEYWORDS: Calibration, Cameras, Metrology, Distortion, 3D acquisition, Imaging systems, Photogrammetry, Optical fibers, Machine vision, Computer vision technology

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