Mark A. Manzardo
EO Engineer
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 19 July 1999 Paper
Kenneth Allred, Mark Manzardo, David Anderson, Kenneth LeSueur, Eddie Burroughs
Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352918
KEYWORDS: Nonuniformity corrections, Image processing, Sensors, Infrared imaging, Resistors, Projection systems, Distortion, Composites, Infrared radiation, Calibration

Proceedings Article | 19 July 1999 Paper
Kenneth Zabel, Rob Stone, Larry Martin, Richard Robinson, Mark Manzardo
Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352891
KEYWORDS: Sensors, Projection systems, Forward looking infrared, Infrared sensors, Nonuniformity corrections, Infrared imaging, Infrared radiation, Control systems, Optical design, Interfaces

Proceedings Article | 19 July 1999 Paper
Mark Manzardo, Eddie Burroughs, Thomas Kelly
Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352899
KEYWORDS: Resistors, Sensors, Infrared radiation, Projection systems, Electronics, Long wavelength infrared, Nonuniformity corrections, Infrared imaging, Calibration, Radiometry

Proceedings Article | 19 July 1999 Paper
Mark Manzardo, Thomas Joyner, Keem Thiem
Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352895
KEYWORDS: Resistors, Sensors, Nonuniformity corrections, Infrared sensors, Infrared imaging, Infrared radiation, Projection systems, Control systems, Infrared search and track, Missiles

Proceedings Article | 13 July 1998 Paper
Mark Manzardo, Kenneth Zabel, Howard Graves III, Bruce Tucker, Eddie Burroughs, Kenneth LeSueur
Proceedings Volume 3368, (1998) https://doi.org/10.1117/12.316380
KEYWORDS: Nonuniformity corrections, Sensors, Infrared imaging, Calibration, Frame grabbers, Interfaces, Image processing, Infrared radiation, Projection systems, Image sensors

Showing 5 of 10 publications
Conference Committee Involvement (4)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
29 March 2005 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
13 April 2004 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
21 April 2003 | Orlando, Florida, United States
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