Martin Teichmann
at European XFEL GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019 Paper
G. Mercurio, C. Broers, R. Carley, J. T. Delitz, N. Gerasimova, L. Le Guyarder, L. Mercadier, A. Reich, J. Schlappa, M. Teichmann, A. Yaroslavtsev, M. Cascella, K. Setoodehnia, M. Schneider, B. Pfau, S. Eisebitt, V. Vozda, V. Hájková, L. Vyšín, T. Burian, J. Chalupský, L. Juha, S. G. Alcock, I. Nistea, D. La Civita, H. Sinn, M. Vannoni, A. Scherz
Proceedings Volume 11109, 111090F (2019) https://doi.org/10.1117/12.2530725
KEYWORDS: Mirrors, X-rays, Free electron lasers, Sensors, Computer programming, Diffraction gratings, Scattering, Spectroscopes, Metrology

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