Dr. Masatoshi Kotera
at Osaka Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2018 Paper
Proceedings Volume 10810, 108100B (2018) https://doi.org/10.1117/12.2504822
KEYWORDS: Electrodes, Objectives, Scanning electron microscopy, Scattering, Electron microscopes, Computer simulations, Monte Carlo methods, Selenium, Electron beams, Laser scattering

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