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Matthias Fill
at Camlin Technologies (Switzerland) AG
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Author
Publications (4)
Proceedings Article | 15 February 2012 Paper
IV-VI mid-infrared VECSEL on Si-substrate
M. Fill, F. Felder, M. Rahim, A. Khiar, R. Rodriguez, H. Zogg, A. Ishida
Proceedings Volume 8242, 82420H (2012) https://doi.org/10.1117/12.905643
KEYWORDS: Quantum wells, Mirrors, Temperature metrology, Lead, Group IV-VI semiconductors, Silicon, Mid-IR, Absorption, Crystals, Applied physics
Proceedings Article | 2 September 2009 Paper
IV-VI mid-IR tunable lasers and detectors with external resonant cavities
H. Zogg, M. Rahim, A. Khiar, M. Fill, F. Felder, N. Quack, S. Blunier, J. Dual
Proceedings Volume 7453, 74530R (2009) https://doi.org/10.1117/12.829653
KEYWORDS: Mirrors, Mid-IR, Sensors, Microelectromechanical systems, Silicon, Diffusion, Temperature metrology, Quantum wells, Photodiodes, Tunable lasers
Proceedings Article | 28 February 2009 Paper
Lead-chalcogenide VECSELs on Si and BaF2 for 5 μm emission
M. Rahim, A. Khiar, F. Felder, M. Fill, D. Boye, H. Zogg
Proceedings Volume 7193, 71931G (2009) https://doi.org/10.1117/12.816359
KEYWORDS: Mirrors, Silicon, Optical pumping, Refractive index, Quantum wells, Temperature metrology, Mid-IR, Vertical external cavity surface emitting lasers, Aluminum
Proceedings Article | 3 September 2008 Paper
Epitaxial lead-chalcogenides on Si and BaF2 for mid-IR detectors and emitters including cavities
H. Zogg, M. Arnold, F. Felder, M. Rahim, M. Fill, D. Boye
Proceedings Volume 7082, 70820H (2008) https://doi.org/10.1117/12.797849
KEYWORDS: Mirrors, Silicon, Mid-IR, Sensors, Diodes, Diffusion, Micromirrors, Reflectivity, Microelectromechanical systems, Photodiodes
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