Dr. Matthias Schicke
Global Key Account Manager at FUJIFILM Electronic Materials
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 April 2024 Presentation + Paper
K. Varga, M. Weinhart, R. Holly, T. Zenger, B. Považay, F. Bögelsack, A. Spitzer, T. Uhrmann, H. Takishita, Y. Taguchi, J. Koch, M. Schicke
Proceedings Volume 12956, 129560B (2024) https://doi.org/10.1117/12.3010156
KEYWORDS: Optical lithography, Semiconducting wafers, Distortion, RGB color model, Optical alignment, Image sensors, Semiconductors, Metals, Matrices, Sensors

Proceedings Article | 8 October 2004 Paper
Matthias Schicke, Alessandro Navarrini, Karl-Friedrich Schuster
Proceedings Volume 5498, (2004) https://doi.org/10.1117/12.566398
KEYWORDS: Bridges, Niobium, Microelectromechanical systems, Electrodes, Bandpass filters, Capacitors, Capacitance, Digital filtering, Superconductors, Molecular bridges

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