Merve Uysal
at ASELSAN AS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 June 2023 Presentation + Paper
H. Eroglu, M. Uysal, B. Asici, Y. Ergunt
Proceedings Volume 12534, 125340S (2023) https://doi.org/10.1117/12.2663762
KEYWORDS: Cadmium telluride, Semiconducting wafers, Polishing, Surface finishing, Surface roughness, Particles, Mercury cadmium telluride, Image processing, Histograms, Optical interferometry, Image analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top