Mr. Mingjie Deng Profile

Mingjie Deng

at National Univ of Defense Technology

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 5 November 2020 Paper

Analysis of influence factors of surface defects detection on optical components

Mingjie Deng, Feng Shi, Guoyan Sun, Shuai Xue, Guipeng Tie

Proceedings Volume 11567, 1156704 (2020) https://doi.org/10.1117/12.2572696

KEYWORDS: Defect detection, Signal to noise ratio, Optical components, Light scattering, Image acquisition, Light sources, Charge-coupled devices, Light, Factor analysis

Read Abstract +

Most of the existing defect detectors focus on the size, location, depth and number of defects of the tested components. The instrument is usually large in size and requires high accuracy for the environment and motion devices. In contrast, the direct random bed motion, which aims at finding and locating defects, is highly efficient, low-cost and environmentally practical, while the research on vibration-resistant defect tester is rare.In order to solve this problem, based on the principle of micro-scattering imaging in dark field, a set of optical component surface defect detection device is built, and the influence factors of light intensity, illumination angle, wavelength and other defect detection factors are experimentally studied, in order to provide design basis for the follow-up development of on-line defect detection instrument. The experimental results show that the most important factor affecting the sensitivity is the azimuth angle and pitch angle of the incident light, which is more than 30 degrees between the incident light and the scratch direction. When the pitch angle is between 60 degrees and 70 degrees, the higher detection sensitivity can be obtained. In addition, improving the illumination intensity can help to improve the detection of defects. In the visible range, the wavelength has little effect on the sensitivity.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years