Mr. Nathan L. Bishop Profile

Nathan L. Bishop

at Pennsylvania State Univ

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Author

Publications (6)

Proceedings Article | 5 October 2023 Poster + Paper

Thin-film PZT actuator performance in adjustable x-ray optic segments

Kenneth Buffo, Casey DeRoo, Paul Reid, Vladimir Kradinov, Vanessa Marquez, Susan Trolier-McKinstry, Nathan Bishop, Thomas Jackson, Quyen Tran, Hanyuan Liang, Tianning Liu, Mohit Tendulkar

Proceedings Volume 12679, 1267915 (2023) https://doi.org/10.1117/12.2675949

KEYWORDS: Mirrors, Iterated function systems, Actuators, X-ray optics, Finite element methods, X-rays, Ferroelectric materials, Thin films, Piezoelectric thin film actuators, Electrodes

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SPIE Journal Paper | 2 June 2022

Stress-balancing in piezoelectric adjustable x-ray optics

Nathan Bishop, Vladimir Kradinov, Paul Reid, Thomas Jackson, Casey DeRoo, Susan Trolier-McKinstry

JATIS, Vol. 8, Issue 02, 029004, (June 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.2.029004

KEYWORDS: Mirrors, Actuators, X-ray optics, X-rays, Thin films, Glasses, Iridium, Coating, Prototyping, Sputter deposition

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Proceedings Article | 23 August 2021 Presentation + Paper

Process development for adjustable X-ray mirrors

Mohit Tendulkar, Tianning Liu, Nicole Kirchner-Hall, Nathan Bishop, Quyen Tran, Casey DeRoo, Vincenzo Cotroneo, Vladimir Kradinov, Vanessa Marquez, Paul Reid, Susan Trolier-McKinstry, Thomas Jackson

Proceedings Volume 11822, 1182213 (2021) https://doi.org/10.1117/12.2595316

KEYWORDS: Active optics, Thin film devices, Piezoelectric thin film actuators, X-ray optics, Mirrors, X-rays, Actuators, Ferroelectric materials, Zinc oxide, Lithography

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Proceedings Article | 5 August 2021 Presentation

Optical metrology of an adjustable x-ray mirror prototype

Casey DeRoo, Paul Reid, Vanessa Marquez, Vladimir Kradinov, Susan Trolier-McKinstry, Nathan Bishop, Thomas Jackson, Mohit Tendulkar, Quyen Tran

Proceedings Volume 11822, 118220Z (2021) https://doi.org/10.1117/12.2594726

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Proceedings Article | 1 August 2021 Presentation

Strain gauging for on-orbit figure monitoring of adjustable X-ray optics: systems analyses

Paul Reid, Vladimir Kradinov, Mark Freeman, Nathan Bishop, Casey DeRoo, Thomas Jackson, Vanessa Marquez, Mohit Tendulkar, Quyen Tran, Susan Trolier-McKinstry

Proceedings Volume 11822, 1182214 (2021) https://doi.org/10.1117/12.2595160

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SPIE Journal Paper | 23 March 2019 Open Access

Thickness distribution of sputtered films on curved substrates for adjustable x-ray optics

Nathan Bishop, Julian Walker, Casey DeRoo, Tianning Liu, Mohit Tendulkar, Vincenzo Cotroneo, Edward Hertz, Vladimir Kradinov, Eric Schwartz, Paul Reid, Thomas Jackson, Susan Trolier-McKinstry

JATIS, Vol. 5, Issue 02, 021005, (March 2019) https://doi.org/10.1117/12.10.1117/1.JATIS.5.2.021005

KEYWORDS: Mirrors, X-ray optics, Sputter deposition, Finite element methods, Glasses, Ferroelectric materials, X-rays, Actuators, Prototyping, Mathematical modeling

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Piezoelectric adjustable x-ray optics use magnetron sputtered thin film coatings on both sides of a thin curved glass substrate. To produce an optic suitable for a mission requiring high-angular resolution like “Lynx,” the integrated stresses (stress×thickness) of films on both sides of the optic must be approximately equal. Thus, understanding how sputtered film thickness distributions change for convex and concave curved substrates is necessary. To address this, thickness distributions of piezoelectric Pb0.995(Zr0.52Ti0.48)0.99Nb0.01O3 films are studied on flat, convex, and concave cylindrical substrates with a 220-mm radius of curvature. A mathematical model of the film thickness distribution is derived based on the geometric properties of the sputter tool and the substrate, and film thicknesses deposited with a commercially available sputtering tool are measured with spectroscopic ellipsometry. Experiment and modeled results for flat and convex curved substrates demonstrate good agreement, with average relative thickness distribution difference of 0.19% and −0.10% respectively, and a higher average difference of 1.4% for concave substrates. The calculated relative thickness distributions are applied to the convex and concave sides of a finite-element analysis (FEA) model of an adjustable x-ray optic prototype. The FEA model shows that, left uncorrected, the relative film thickness variation will yield an optic with an optical performance of 2.6 arc sec half power diameter (HPD) at 1 keV. However, the mirror figure can be corrected to diffraction-limited performance (0.3 arc sec HPD) using the piezoelectric adjusters, suggesting that the tolerances for applying a balanced integrated stress on both sides of a mirror are alleviated for adjustable x-ray optics as compared to traditional static x-ray mirrors. Furthermore, the piezoelectric adjusters will also allow changes in mirror figure over the telescope lifetime due to drift in the stress states of the x-ray surfaces to be corrected on orbit.

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