Nicolas Kaufmann
at Carl Zeiss Microscopy GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 March 2019 Paper
Proceedings Volume 10959, 1095931 (2019) https://doi.org/10.1117/12.2528795
KEYWORDS: Scanning electron microscopy, Sensors, Electron beams, Electron microscopes, Semiconductors, Electron microscopy

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