Patrick J. Treado, PhD is an Analytical Chemist who founded ChemImage in 1994. His research interests involve the development of vis-NIR, Raman, IR and fluorescence molecular chemical imaging and its application to materials analysis, clinical diagnostics, process monitoring, and threat detection. He is the author of more than 150 publications and inventor on more than 120 patents on chemical imaging technology, methodology and applications. He is a fellow of the Society of Applied Spectroscopy and a member of SPIE.
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This paper will discuss the development, characterization, and test results of the first generation SWIR DP-CF imaging sensor, with a focus on its application to explosives and narcotic threat detection.
The SWIR HSI sensor provides real-time standoff detection of surface residues. The SWIR HSI sensor provides wide area surveillance and HSI capability enabled by liquid crystal tunable filter technology. Easy-to-use detection software with a simple, intuitive user interface produces automated alarms and real-time display of threat and type. The system has potential to be used for the detection of variety of threats including chemicals and illicit drug substances and allows for easy updates in the field for detection of new hazardous materials.
SWIR HSI technology could be used by law enforcement for standoff screening of suspicious locations and vehicles in pursuit of illegal labs or combat engineers to support route-clearance applications- ultimately to save the lives of soldiers and civilians.
In this paper, results from a SWIR HSI sensor, which include detection of various materials in bulk form, as well as residue amounts on vehicles, people and other surfaces, will be discussed.
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