Qing Zhang
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2020 Presentation
Proceedings Volume 11249, 112490I (2020) https://doi.org/10.1117/12.2543538
KEYWORDS: Interferometry, Microscopy, Polarization, Polarized microscopy, Liquid crystals, Inspection, Imaging systems, Optical inspection, Visual analytics, Visualization

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