Dr. Renfang Hu Profile

Dr. Renfang Hu

at Univ of Science and Technology of China

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 10 May 2019 Paper

Image correction method without gain correction in grating-based x-ray phase-contrast imaging

Guibin Zan, Renfang Hu, Zhao Wu, Qiuping Wang, Wenbing Yun, Ge Wang

Proceedings Volume 11068, 110682A (2019) https://doi.org/10.1117/12.2524694

KEYWORDS: X-rays, X-ray imaging, Sensors, Scattering, Absorption, X-ray detectors, Signal attenuation, Imaging systems, Radiography, Image quality

Read Abstract +

Grating-based X-ray phase-contrast imaging (GPCI) provide complementary attenuation, phase, and scattering contrasts simultaneously, especially useful for imaging samples comprising of mostly low atomic number elements (low-Z materials). These powerful imaging abilities have important applications in medical diagnostics and biological research. Critical optical components such as gratings in GPCI make GPCI more sensitive, at the cost of difficulties in the experimental operation. In this study, a new detector image correction method in GPCI is developed to simplify the data collection and image processing. Generally, both offset (dark-current) and gain corrections need to be performed for conventional image correction. Based on the principle of GPCI, here we analyze theoretically the influences of dark-current and inhomogeneity of the detector on the images of GPCI, and find that only the offset correction is necessary for the attenuation and scattering contrast images. Then, a simplified image correction method without gain correction is proposed for GPCI. The experiments performed on a prototype for non-interferometric grating-based X-ray phase-contrast imaging confirm the feasibility and validity of the proposed method. Compared with conventional image correction, the new image correction method can achieve the same performance only with offset correction. Therefore, the new method simplifies the experimental operation and facilitates the use of GPCI for radiographic applications in materials science, biomedical imaging, and industrial non-destructive inspection.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years