Dr. Richard Hollinger
at Carl Zeiss Jena Microscopy GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2021 Presentation + Paper
Proceedings Volume 11770, 117700G (2021) https://doi.org/10.1117/12.2592977
KEYWORDS: Silicon, Mid-IR, Picosecond phenomena, Optical amplifiers, Nanostructures, Wafer-level optics, Structural engineering, Semiconducting wafers, Sapphire, Resonance enhancement

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