Dr. Rolf Kaufmann
at EMPA
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 25 September 2017 Paper
Rolf Kaufmann, Mathieu Plamondon, Jürgen Hofmann, Antonia Neels
Proceedings Volume 10391, 1039115 (2017) https://doi.org/10.1117/12.2275144
KEYWORDS: Phase measurement, Interferometers, Phase retrieval, X-rays, Sensors, Image processing, X-ray technology, Phase contrast, Synchrotrons, Materials science

Proceedings Article | 21 October 2016 Presentation + Paper
Fei Yang, Michele Griffa, Alexander Hipp, Hannelore Derluyn, Peter Moonen, Rolf Kaufmann, Matthieu Boone, Felix Beckmann, Pietro Lura
Proceedings Volume 9967, 99670L (2016) https://doi.org/10.1117/12.2236221
KEYWORDS: X-rays, Visualization, Spatial resolution, X-ray imaging, Water, Cements, X-ray imaging, Phase contrast, Tomography, Image segmentation, Signal attenuation

Proceedings Article | 20 May 2009 Paper
Johann Osmond, Giovanni Isella, Daniel Chrastina, Hans von Känel, Rolf Kaufmann, Laurent Vivien, Gilles Rasigade, Delphine Marris-Morini, Paul Crozat, Eric Cassan, Suzanne Laval
Proceedings Volume 7366, 73660B (2009) https://doi.org/10.1117/12.821714
KEYWORDS: Photodetectors, Germanium, Diodes, Silicon, Optical communications, Integrated optics, Plasma, Ions, External quantum efficiency, Eye

Proceedings Article | 26 January 2006 Paper
Bernhard Büttgen, Thierry Oggier, Michael Lehmann, Rolf Kaufmann, Simon Neukom, Michael Richter, Matthias Schweizer, David Beyeler, Roger Cook, Christiane Gimkiewicz, Claus Urban, Peter Metzler, Peter Seitz, Felix Lustenberger
Proceedings Volume 6056, 605603 (2006) https://doi.org/10.1117/12.642305
KEYWORDS: Modulation, Sensors, Demodulation, Cameras, Signal detection, Distance measurement, Diffusion, Electrons, Head, Image processing

Proceedings Article | 17 January 2005 Paper
Thierry Oggier, Rolf Kaufmann, Michael Lehmann, Bernhard Buttgen, Simon Neukom, Michael Richter, Matthias Schweizer, Peter Metzler, Felix Lustenberger, Nicolas Blanc
Proceedings Volume 5665, 566501 (2005) https://doi.org/10.1117/12.586933
KEYWORDS: 3D-TOF imaging, Sensors, 3D image processing, Time of flight imaging, Cameras, Sun, Modulation, Solid state electronics, Image sensors, Time metrology

Showing 5 of 8 publications
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