Prof. Ronald Albert Lawes
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 2 April 2004 Paper
Ronald Lawes, Graham Arthur
Proceedings Volume 5276, (2004) https://doi.org/10.1117/12.532759
KEYWORDS: Polymethylmethacrylate, Synchrotrons, X-rays, Semiconducting wafers, Helium, Photons, Beryllium, Glasses, Photomasks, Absorption

Proceedings Article | 19 November 2001 Paper
Proceedings Volume 4593, (2001) https://doi.org/10.1117/12.448845
KEYWORDS: Synchrotrons, Photomasks, Manufacturing, Polymethylmethacrylate, X-rays, Beryllium, Nickel, Semiconducting wafers, Photoresist processing, Gold

Proceedings Article | 7 June 1996 Paper
Nadeem Rizvi, Malcolm Gower, Dominic Ashworth, Neil Sykes, Phil Rumsby, Bruce Smith, Francis Goodall, Ronald Lawes
Proceedings Volume 2726, (1996) https://doi.org/10.1117/12.240981
KEYWORDS: Semiconducting wafers, Excimer lasers, Imaging systems, Polymethylmethacrylate, Photoresist materials, Laser development, Optical lithography, Silica, Deep ultraviolet, Combined lens-mirror systems

Proceedings Article | 1 April 1992 Paper
Proceedings Volume 1573, (1992) https://doi.org/10.1117/12.57747
KEYWORDS: Excimer lasers, Laser ablation, Lenses, Polymers, Lens design, Manufacturing, Laser processing, Deep ultraviolet, Laser development, Pulsed laser operation

Proceedings Volume Editor (1)

SPIE Conference Volume | 21 March 2001

Conference Committee Involvement (8)
Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems IV
10 December 2008 | Melbourne, Australia
Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV
5 December 2007 | Canberra, ACT, Australia
Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III
11 December 2006 | Adelaide, Australia
Device and Process Technologies for Microelectronics, MEMS, and Photonics IV
12 December 2005 | Brisbane, Australia
Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II
13 December 2004 | Sydney, Australia
Showing 5 of 8 Conference Committees
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