Dr. Samuel Sonderegger Profile

Dr. Samuel Sonderegger

Co-Founder/CEO/Director at Attolight AG

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 11 November 2016 Presentation

Combined continuous and time-resolved CL to study semiconductor structure and defects (Conference Presentation)

Samuel Sonderegger, David Gachet, Jean Berney

Proceedings Volume 9926, 99260M (2016) https://doi.org/10.1117/12.2237613

KEYWORDS: Scanning electron microscopy, Electron microscopes, Ultraviolet radiation, Spectroscopy, Imaging spectroscopy, Ultrafast phenomena, Semiconductors, Electron beams, Optical spectroscopy

Read Abstract +

Spectroscopic information may be acquired using an electron beam in a modern scanning electron microscope (SEM), exploiting the cathodoluminescence (CL) signal. CL offers several advantages over the usual optical spectroscopy. The multimode imaging capabilities of the SEM enable the correlation of optical properties (via CL) with surface morphology (secondary electron mode) at the nanometer scale and the large energy of the electrons allows the excitation of wide-bandgap materials. Here, we present results obtained on a field emission time-resolved and continuous (CW) cathodoluminescence scanning electron microscope. The microscope can either be operated in CW mode by heating up the emitter (Schottky emission), or in time-resolved mode by illuminating the field emission gun with a femtosecond UV laser, so that ultrafast electron pulses are emitted through the photoelectric effect. In both modes, a spacial resolution around 10 nm is demonstrated. The collected cathodoluminescence signal is dispersed in a spectrometer and analyzed with a CCD camera (CW mode) or an ultrafast STREAK camera to obtain <10 ps time resolution (TR mode). Quantitative CW cathodoluminescence was first used to quickly map defects in III-V semiconductor structures. Then, time-resolved cathodoluminescence measurements were carried out on specific regions in order to measure local lifetimes and carrier diffusion within the structures. We will also discuss the advantages of combining CL with a scanning transmission electron microscope (STEM) and introduce Attolight’s most recent developments in this field.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years