Dr. Saulius Nevas
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2004 Paper
Saulius Nevas, Farshid Manoocheri, Erkki Ikonen, Alexander Tikhonravov, Michail Kokarev, Michail Trubetskov
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512700
KEYWORDS: Transmittance, Thin films, Refractive index, Spectrophotometry, Polarization, Collimation, Optical testing, Reflectivity, Refraction, Absorption

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