For the industrialization of Point-of-care applications, the miniaturization of diagnostic microscopes maintaining their performance for a reasonable pricing and a fast time-to-market are the biggest challenges. Providing application-tailored digital microscope subsystems for integration into next-generation devices, they have to meet the needs for image quality, automation and digitalization. With the invention of JENOPTIK SYIONS as a platform for many different applications (E.g. fluorescence, bright field, dark-field, Raman microscopy) a concept is proven to be reliable and flexible on, e.g. size, application-dependent target resolutions or needed field-of views.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.