Mr. Shane T. Todd Profile

Shane T. Todd

Research Assistant at Univ of Florida

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 28 February 2005 Paper

An analytical electrothermal model of a 1D electrothermal MEMS micromirror

Shane Todd, Huikai Xie

Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582136

KEYWORDS: Actuators, Convection, Resistance, Thermal modeling, Resistors, Mirrors, Instrument modeling, Micromirrors, Finite element methods, Terbium

Read Abstract +

We have developed an analytical model that describes the steady-state thermal behavior of a 1-D electrothermal bimorph MEMS micromirror. The steady-state 1-D heat transport equation is used to solve for the temperature distribution of the device upon actuation. Three models are developed using different thermal conditions on the device. The models consider heat dissipation from conduction and convection and the temperature dependence of the actuator electrical resistor. The temperature distribution equation of each model is analyzed to find critical thermal parameters such as the position of maximum temperature, maximum temperature, average temperature, and equivalent thermal resistance. The simplest model, called the Case 1 model, is used to develop an electrothermal lumped element model that uses a single thermal power source. In the Case 1 model, it is shown that a parameter called the “balancing factor” predicts where the maximum temperature is located, the distribution of power flow, and the division of thermal resistances. The analytical models are compared to FEM simulations and agree within 20% for all of the actuation ranges and thermal conditions tested.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years