Simon-Didier Venzal
at Thales LAS France SAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 June 2023 Presentation + Paper
Proceedings Volume 12534, 125340B (2023) https://doi.org/10.1117/12.2663446
KEYWORDS: Reliability, Cryocoolers, Accelerated life testing, Power consumption, Cryogenics, Design and modelling

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