Simon J. Ward
at Vanderbilt Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 4 October 2023 Presentation + Paper
Proceedings Volume 12675, 126750E (2023) https://doi.org/10.1117/12.2676836
KEYWORDS: Time series analysis, Deep learning, Uncertainty analysis, Neural networks, Sensors, Data modeling, Biosensors, Reflectivity, Machine learning, Silicon, Semiconducting wafers

Proceedings Article | 17 March 2023 Presentation
Rabeb Layouni, Juliana Yang, Simon Ward, Paul Laibinis, Sharon Weiss
Proceedings Volume PC12397, PC123970B (2023) https://doi.org/10.1117/12.2653126
KEYWORDS: Silicon, Diagnostics, Computer simulations, Thin films, Silicon films, Sensors, Reflectivity, Optical testing, Molecules, Finite element methods

Proceedings Article | 4 March 2022 Presentation + Paper
Proceedings Volume 11979, 1197907 (2022) https://doi.org/10.1117/12.2614697
KEYWORDS: Proteins, Data modeling, Machine learning, Principal component analysis, Sensors, Molecules, Silicon, Biosensing, Semiconducting wafers, Reflectance spectroscopy, Optical biosensors, Dimension reduction, Classification systems, Point-of-care devices

Proceedings Article | 16 March 2021 Presentation + Paper
Proceedings Volume 11662, 116620J (2021) https://doi.org/10.1117/12.2579361
KEYWORDS: Signal processing, Thin films, Reflectivity, Interference (communication), Refractive index, Lamps, Filtering (signal processing), Wavelets, Sensors, Fabry–Perot interferometers

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