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Stephen Trewick
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Publications (1)
Proceedings Article | 12 May 2015 Paper
Test pixels for high-temperature infrared scene projection
Christopher Fredricksen, Seth Calhoun, Stephen Trewick, Aubrey Coffey, Edward Dein, Kevin Coffey, Robert Peale, Joseph LaVeigne, Gregory Franks, Tom Danielson, John Lannon, Scott Goodwin
Proceedings Volume 9452, 94520X (2015) https://doi.org/10.1117/12.2177025
KEYWORDS: Etching, Resistance, Infrared radiation, Silicon, Dielectrics, Metals, Semiconducting wafers, Dry etching, Resistors, Mid-IR
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