Thomas Blasiak
SPIE Involvement:
Author
Area of Expertise:
optics , imaging , lithography , operations , quality , management
Websites:
Profile Summary

Innovative leader with an international mindset who
can improve business processes and apply advanced
technology for competitive advantage

Specializing in measuring, monitoring, and controlling
nanometer-scale process specifications in manufacturing
and development operations

Can effectively apply:
• Statistical methods to reduce process variability, and improve production yields
• Operations management techniques to optimize cycle-times and efficiency
• Organizational principles to build and lead productive, motivated teams
• Engineering standards for development, quality, and manufacturing
• Advanced metrology tools and techniques for process control
Publications (1)

Proceedings Article | 30 January 2002 Paper
Thomas Blasiak, Semyon Zheleznyak
Proceedings Volume 4485, (2002) https://doi.org/10.1117/12.454272
KEYWORDS: Diffraction gratings, Telescopes, Kinematics, Astronomy, Observatories, Astronomical telescopes, Optical design, Control systems, Wavefronts, Interferometers

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