Dr. Thomas A. Reichardt
Principal Member Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12094, 120940T (2022) https://doi.org/10.1117/12.2618425
KEYWORDS: Skin, Reflectivity, Light scattering, Blood, Hyperspectral imaging, Data modeling, Sensors

Proceedings Article | 14 May 2018 Presentation
Proceedings Volume 10655, 106550F (2018) https://doi.org/10.1117/12.2309701
KEYWORDS: Infrared spectroscopy, Long wavelength infrared, Infrared radiation, Reflectometry, Instrument modeling, Calibration, Measurement devices, Sensors, Bidirectional reflectance transmission function, FT-IR spectroscopy

Proceedings Article | 17 May 2016 Paper
T. Kulp, R. Sommers, K. Krafcik, B. Mills, T. Reichardt, J. Dorrance, C. LaCasse, K. Fuerschbach, J. Craven
Proceedings Volume 9840, 98400H (2016) https://doi.org/10.1117/12.2224637
KEYWORDS: Reflectivity, Solids, Solid modeling, Particles, Systems modeling, Scattering, Atmospheric modeling, Silica, Data modeling, Birefringence

Proceedings Article | 17 May 2016 Paper
Dave Engel, Thomas Reichardt, Thomas Kulp, David Graff, Sandra Thompson
Proceedings Volume 9840, 98400N (2016) https://doi.org/10.1117/12.2224262
KEYWORDS: Solid modeling, Solids, Process modeling, Data modeling, Reflectivity, Calibration, Sensors, Atmospheric modeling, Particles, Systems modeling

Proceedings Article | 17 May 2016 Paper
Proceedings Volume 9840, 98400M (2016) https://doi.org/10.1117/12.2224071
KEYWORDS: Particles, Data modeling, Atmospheric modeling, Reflectivity, Radiative transfer, Atmospheric particles, Refractive index, Silica, Scattering, Surface roughness

Showing 5 of 9 publications
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