Tianyu Zhang
at Xi'an Jiaotong Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 November 2021 Paper
Proceedings Volume 12057, 120571B (2021) https://doi.org/10.1117/12.2604755
KEYWORDS: Structured light, Optical metrology, Phase measurement, Phase shifting, Phase retrieval, Fringe analysis, 3D metrology, Phase shifts, Projection systems, Cameras, Calibration, Imaging systems, Edge detection, Digital Light Processing

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