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Tim H. Muster
at CSIRO
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 2 September 2010 Paper
Data-constrained microstructure modeling with multi-spectrum x-ray CT
Y. Yang, A. Tulloh, T. Muster, A. Trinchi, S. Mayo, S. Wilkins
Proceedings Volume 7804, 78040N (2010) https://doi.org/10.1117/12.861964
KEYWORDS: X-rays, Data modeling, Electron beams, Strontium, Signal attenuation, Corrosion, Tomography, Scanning electron microscopy, 3D modeling, Titanium dioxide
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