Development of large-scale photonic integrated circuits requires an accurate, simple, and space-efficient method for characterizing the optical losses of integrated optical components. Here we present a ring-resonator-based technique for transmission-loss measurement of integrated optical components. Y-branch splitters are used to demonstrate the concept. This measurement techique is based on characterizing the spectral response of a waveguide ring resonator with a number of Y-branches inserted inside the cavity. The measurement accuracy is intrinsically limited by the optical loss of the ring waveguide and is independent of fiber-to-waveguide coupling losses. The devices were fabricated using a CMOS-compatible silicon-on-insulator technology. Our results show that the proposed technique is promising for high-accuracy, high-efficiency characterization of optical losses. Limitations of and potential improvements to the technique are also discussed.
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