Tobias Grunewald
at Physikalisch-Technische Bundesanstalt (PTB)
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 July 2019 Presentation
Proceedings Volume 11057, 110570S (2019) https://doi.org/10.1117/12.2527866
KEYWORDS: Statistical analysis, Ellipsometry, Computer simulations, Spectroscopic ellipsometry, Optical testing, Inverse optics, Inverse problems, Polarization, Maxwell's equations, Error analysis

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